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International Forum on Terahertz Spectroscopy and Imaging - 4th Workshop on Terahertz Technology
| When |
Tuesday,
02-03-2010
to Wednesday, 03-03-2010 |
|---|---|
| Where | Kaiserslautern |
| Contact Name | Dr. Joachim Jonuscheit |
| Contact Email | joachim.jonuscheit@ipm.fraunhofer.de |
| Contact Phone | +49 (0)631 2 05-51 07 |
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Nowadays Terahertz technology has proven to be a valuable tool for applications in diagnostics, measurement and testing. The industrial use of this technology, however, raises a lot of challenging questions.
The “International Forum on Terahertz Spectroscopy and Imaging” especially fosters the exchange of knowledge and experience between academics and industry in this exciting and rapidly developing field. The renowned experts in the field of Terahertz Technology which have confirmed invited lectures to the forum include
- Prof. Dr. Daniel R. Grischkowski, Oklahoma State University, USA
- Prof. Dr. Jérôme Faist, ETH Zürich, Switzerland
- Prof. Dr. Kodo Kawase, Nagoya University and RIKEN, Japan
- Dr. Mike Kemp, Iconal Technology Ltd, UK
The fourth forum will address primarily the topics
- Nondestructive Materials Testing
- Technology for Homeland Security
- New Technologies
- Health and Social Aspects of Terahertz Technology
Contributions are welcome preferably - but not exclusively – in the topics mentioned above. We encourage experts from industry and universities to present new development results in the field of the workshop.
Submission of Abstracts: Online submission of abstracts in English under the address www.vdi.de/gma/terahertz2010 is strongly preferred. The abstract should not exceed approx. 400 words / 1 page A4 and give a concise résumé of the planned contribution. Preference of oral or poster presentation should be indicated.
Deadline for submission of abstracts is November 20th, 2009.
The submitted abstracts will be reviewed by the program committee. Authors will be notified not later than December 23rd, 2009.
Program Committee:
- Prof. Dr. Elmar Wagner, Fraunhofer Institute for Physical Measurement Techniques (IPM), Germany
- Prof. Dr. René Beigang, University of Kaiserslautern, Germany
- Prof. Dr. Xi-Cheng Zhang, Rensselaer Polytechnic Institute, USA
- Prof. Dr. Uwe Ewert, Federal Institute for Materials Research and Testing (BAM), Germany
- Dr. Wolfgang Kasten, BASF SE, Germany
- Dr. Ulrich Kallmann, Robert Bosch GmbH, Germany
- Dr. Roger Appleby, QinetiQ Ltd, UK
Workshop Fee: The workshop fee will be € 345,00.
Exhibition: The workshop will be accompanied by a table top exhibition. Authors from industry are encouraged to contribute to the exhibition, too. The exhibition fee will be € 250 plus the regular workshop fee. Please contact Dr. J. Jonuscheit (E-Mail: joachim.jonuscheit@ipm.fraunhofer.de) for further information.
The 4th Workshop on Terahertz Technology is jointly organized by Fraunhofer Institute for Physical Measurement Techniques (IPM) and the Division Optical Technologies of the VDI/VDE Society for Measurement and Automatic Control (GMA).